Analog signal generation for built-in-self-test of mixed-signal integrated circuits
Finna-arvio
Analog signal generation for built-in-self-test of mixed-signal integrated circuits
Tallennettuna:
| Ulkoasu |
122 s |
|---|---|
| Kieli |
englanti |
| Alkuteoksen kieli |
englanti |
| Huomautukset |
Lisäpainokset: Fifth printing 1998. |
| Julkaisija |
Boston :
Kluwer Academic,
cop. 1995.
|
| Sarja | The Kluwer international series in engineering and computer science, Analog circuits and signal processing SECS, 312. |
| Luokitus | |
| Lisätiedot | by Gordon W. Roberts, Albert K. Lu |
| ISBN |
0-7923-9564-6 kovakantinen |
| Hae kokoteksti | |