Combined thermal, thermodynamic and kinetic modelling for the reliability of high-density lead-free solder interconnections
Combined thermal, thermodynamic and kinetic modelling for the reliability of high-density lead-free solder interconnections
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Genre | |
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Physical Description |
II, VII, 48, [75] sivu : kuvitettu ; 25 cm Julkaistu myös verkkoaineistona Julkaistu myös verkkoaineistona (ISBN 951-22-8464-2, 978-951-22-8464-1) |
Language |
English |
Language of Original Work |
English |
Item Description |
Artikkeliväitöskirjan yhteenveto-osa ja 6 eripainosta. |
Published |
Espoo :
Helsinki University of Technology,
2006
|
Dissertation Note | Väitöskirja : Teknillinen korkeakoulu, Espoo |
Series | Helsinki University of Technology. Department of Electrical and Communications Engineering. Laboratory of Electronics Production Technology, ISSN 1457-0440; 15 |
Classification | |
Subjects | |
Manufacturer | (Otamedia) |
Additional Information | Hao Yu |
ISBN |
978-951-22-8463-4 nidottu 951-22-8464-2 PDF 978-951-22-8464-1 PDF |
Standard number |
TKK-DISS-2215 |
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