Chapter Opportunities of Scanning Probe Microscopy for Electrical, Mechanical and Electromechanical Research of Semiconductor Nanowires
Finna-arvio
Chapter Opportunities of Scanning Probe Microscopy for Electrical, Mechanical and Electromechanical Research of Semiconductor Nanowires
Tallennettuna:
| Kieli |
englanti |
|---|---|
| Julkaisija |
InTechOpen,
2017
|
| Hae kokoteksti | |