Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy
Finna-arvio
Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy
Tallennettuna:
| Kieli |
englanti |
|---|---|
| Julkaisija |
Springer US,
1990
|
| ISBN |
0-306-43591-8 1-4613-0635-3 |
| Hae kokoteksti | |