Reliability And Radiation Effects In Compound Semiconductors
Finna-arvio
Reliability And Radiation Effects In Compound Semiconductors
Tallennettuna:
| Kieli |
englanti |
|---|---|
| Julkaisija |
World Scientific Publishing Company,
2010
|
| Aiheet | |
| ISBN |
981-4277-10-X 9786613143747 1-61583-687-X 1-283-14374-7 981-4277-11-8 |
| Hae kokoteksti | |