In-situ Electron Microscopy At High Resolution
Finna-arvio
In-situ Electron Microscopy At High Resolution
Tallennettuna:
Kieli |
englanti |
---|---|
Julkaisija |
World Scientific Publishing Company,
2008
|
Aiheet | |
ISBN |
981-279-733-5 1-61344-079-0 981-279-734-3 |
Hae kokoteksti |