Scanning Force Microscopy : With Applications to Electric, Magnetic, and Atomic Forces
Finna-arvio
Scanning Force Microscopy : With Applications to Electric, Magnetic, and Atomic Forces
Tallennettuna:
| Kieli |
englanti |
|---|---|
| Julkaisija |
New York
Oxford University Press (US),
1991
|
| ISBN |
0-19-509204-X 0-19-506270-1 0-19-773261-5 9786610441785 0-19-802281-6 1-280-44178-X 0-19-534469-3 1-60256-628-3 |
| Hae kokoteksti | |