Excess coincidences of spontaneous and stimulated x rays
Finna-recension
Excess coincidences of spontaneous and stimulated x rays
Sparad:
| Fysisk beskrivning |
16, [2] sivua ; 26 cm |
|---|---|
| Språk |
engelska |
| Originalverkets språk |
engelska |
| Förlag |
Espoo :
Helsinki University of Technology, Metrology Research Institute,
2003
|
| Serie | Metrology Research Institute report, ISSN 1237-3281; 22. |
| Klassifikation | |
| Tillverkare | (Helsinki : Picaset) |
| Mer information | E. Ikonen |