Excess coincidences of spontaneous and stimulated x rays
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Excess coincidences of spontaneous and stimulated x rays
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| Physical Description |
16, [2] sivua ; 26 cm |
|---|---|
| Language |
English |
| Language of Original Work |
English |
| Published |
Espoo :
Helsinki University of Technology, Metrology Research Institute,
2003
|
| Series | Metrology Research Institute report, ISSN 1237-3281; 22. |
| Classification | |
| Manufacturer | (Helsinki : Picaset) |
| Additional Information | E. Ikonen |