Development of instrumentation and methods for positron spectroscopy of defects in semiconductors
Development of instrumentation and methods for positron spectroscopy of defects in semiconductors
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| Genre | |
|---|---|
| Physical Description |
iv, 31, [57] sivua : kuvitettu ; 25 cm |
| Language |
English |
| Language of Original Work |
English |
| Item Description |
Artikkeliväitöskirjan yhteenveto-osa ja 6 eripainosta. |
| Published |
Espoo :
Helsinki University of Technology,
2001
|
| Dissertation Note | Väitöskirja Espoo : Teknillinen korkeakoulu |
| Series | Dissertation / Laboratory of Physics, Helsinki University of Technology, ISSN 1455-1802; 113. |
| Classification | |
| Manufacturer | (Otamedia) |
| Additional Information | Jaani Nissilä |
| ISBN |
951-22-5467-0 nidottu 951-22-5468-9 verkkoaineisto |
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