Identification of point defect structures in semiconductors by positron annihilation : application to silicon and compound semiconductors
Identification of point defect structures in semiconductors by positron annihilation : application to silicon and compound semiconductors
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| Genre | |
|---|---|
| Physical Description |
52 sivua : kuvitettu ; 25 cm |
| Language |
English |
| Language of Original Work |
English |
| Item Description |
Väitöskirjan tiivistelmäosa |
| Published |
Espoo :
Helsinki University of Technology,
1997
|
| Dissertation Note | Väitöskirja Espoo : Teknillinen korkeakoulu |
| Series | Dissertation / Laboratory of Physics, Helsinki University of Technology, ISSN 1455-1802; 104. |
| Classification | |
| Manufacturer | (Libella) |
| Additional Information | Hannu Kauppinen |
| ISBN |
951-22-3761-X nidottu |
| Get full text | |