Application of the x-ray spectroscopic method to texture measurements
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Application of the x-ray spectroscopic method to texture measurements
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| Physical Description |
18 lehteä : kuvitettu ; 4:o |
|---|---|
| Language |
English |
| Language of Original Work |
English |
| Item Description |
Moniste |
| Published |
Otaniemi :
Valtion teknillinen tutkimuskeskus,
1972
|
| Series | Tiedonanto / Valtion teknillinen tutkimuskeskus, reaktorilaboratorio, ISSN 0355-3663; 16 |
| Classification | |
| Manufacturer | (VTT offset) |
| Additional Information | Jerzy Szpunar, Matti Ojanen |