Comparative study of crystal phase, crystallite size and microstrain in the electroluminescent ZnS:Mn films grown by atomic layer epitaxy and electron beam evaporation
Finna-arvio
Comparative study of crystal phase, crystallite size and microstrain in the electroluminescent ZnS:Mn films grown by atomic layer epitaxy and electron beam evaporation
Tallennettuna:
Ulkoasu |
[3], 20 sivua : kuvitettu ; 21 cm |
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Kieli |
englanti |
Alkuteoksen kieli |
englanti |
Huomautukset |
Submitted for publ. in a periodical. |
Julkaisija |
[Hki] :
[Helsinki University of Technology],
1982.
|
Sarja | Report / Helsinki University of Technology. Laboratory of Physics, ISSN 0359-6214; 112. |
Luokitus | |
Lisätiedot | V. P. Tanninen, M. Oikkonen and T. Tuomi |