Explanation of contrast effects in synchrotron x-ray topographs of bent crystals by means of multiple diffraction
Finna-arvio
Explanation of contrast effects in synchrotron x-ray topographs of bent crystals by means of multiple diffraction
Tallennettuna:
Ulkoasu |
[3], 11, [13] sivua : kuvitettu ; 21 cm |
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Kieli |
englanti |
Alkuteoksen kieli |
englanti |
Julkaisija |
[Espoo] :
[Helsinki University of Technology. Laboratory of Physics],
1981.
|
Sarja | Report / Helsinki University of Technology. Laboratory of Physics, P, ISSN 0359-6230; 1981, 13. |
Luokitus | |
Lisätiedot | K. Naukkarinen and T. Tuomi |