Explanation of contrast effects in synchrotron x-ray topographs of bent crystals by means of multiple diffraction
Finna-arvio
Explanation of contrast effects in synchrotron x-ray topographs of bent crystals by means of multiple diffraction
Tallennettuna:
| Ulkoasu |
[3], 11, [13] sivua : kuvitettu ; 21 cm |
|---|---|
| Kieli |
englanti |
| Alkuteoksen kieli |
englanti |
| Julkaisija |
[Espoo] :
[Helsinki University of Technology. Laboratory of Physics],
1981.
|
| Sarja | Report / Helsinki University of Technology. Laboratory of Physics, P, ISSN 0359-6230; 1981, 13. |
| Luokitus | |
| Lisätiedot | K. Naukkarinen and T. Tuomi |