Multiple diffraction lines in the synchrotron x-ray topographs of elastically bent silicon single crystals
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Multiple diffraction lines in the synchrotron x-ray topographs of elastically bent silicon single crystals
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| Physical Description |
[2], 8, [2] sivua : kuvitettu ; 21 cm |
|---|---|
| Language |
English |
| Published |
[Espoo] :
[Helsinki University of Technology],
1981.
|
| Series | Report / Helsinki University of Technology. Laboratory of Physics, P, 1981, 6. |
| Classification | |
| Additional Information | T. Tuomi and K. Naukkarinen |