Excess coincidences of spontaneous and stimulated x rays
Finna-recension
Excess coincidences of spontaneous and stimulated x rays
Sparad:
Fysisk beskrivning |
16, [2] sivua ; 26 cm |
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Språk |
engelska |
Förlag |
Espoo :
Helsinki University of Technology, Metrology Research Institute,
2003
|
Serie | Metrology Research Institute report, ISSN 1237-3281; 22. |
Klassifikation | |
Tillverkare | (Helsinki : Picaset) |
Mer information | E. Ikonen |