Search

Record Citations

APA Citation

Ikonen, E., Ikonen, E., Helsinki University of Technology, & Metrology Research Institute. (2003). Excess coincidences of spontaneous and stimulated x rays. Helsinki University of Technology, Metrology Research Institute.

Chicago Style Citation

Ikonen, Erkki, E. Ikonen, Helsinki University of Technology, and Metrology Research Institute. Excess Coincidences of Spontaneous and Stimulated X Rays. Espoo: Helsinki University of Technology, Metrology Research Institute, 2003.

MLA Citation

Ikonen, Erkki, et al. Excess Coincidences of Spontaneous and Stimulated X Rays. Helsinki University of Technology, Metrology Research Institute, 2003.

Harvard Style Citation

Ikonen, E., Ikonen, E., Helsinki University of Technology & Metrology Research Institute. 2003. Excess coincidences of spontaneous and stimulated x rays. Espoo: Helsinki University of Technology, Metrology Research Institute.

Remember to check citations for accuracy before including them in your work.