TY  - GEN
TY  - GEN
T1  - Reliability And Radiation Effects In Compound Semiconductors
A1  - Johnston, Allan
A2  - Johnston, Allan H.
LA  - eng
PB  - World Scientific Publishing Company
YR  - 2010
UL  - https://kansalliskirjasto.finna.fi/Record/nelli06.2490000000001894
SN  - 981-4277-10-X
SN  - 9786613143747
SN  - 1-61583-687-X
SN  - 1-283-14374-7
SN  - 981-4277-11-8
KW  - Engineering : Electronics
ER  -