TY  - GEN
TY  - GEN
T1  - Excess coincidences of spontaneous and stimulated x rays
T2  - Metrology Research Institute report
A1  - Ikonen, Erkki, 1958-
A2  - Ikonen, E.
A2  - Helsinki University of Technology
A2  - Metrology Research Institute
LA  - eng
PP  - Espoo
PB  - Helsinki University of Technology, Metrology Research Institute
YR  - 2003
UL  - https://kansalliskirjasto.finna.fi/Record/fikka.3984491
ER  -